Amazon cover image
Image from Amazon.com

VLSI Testing: Digital and Mixed Analog Digital Tenchiques

By: Material type: TextTextPublication details: The Institution of Electrical Engineers London 1998Description: 532pISBN:
  • 9780852969014
Subject(s): DDC classification:
  • 621.395 HUR
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 621.395 HUR (Browse shelf(Opens below)) Not For Loan T0048235
Total holds: 0

Introduction
Faults In Digital Circuits
Digital Test Pattern Generation
Signatures And Self Test
Structured Design For Testability DFT Techniques
Testing Of Structured Digital Circuits And Microprocessors
Analogue Testing
Mixed Analogue digital System Test
The Economics Of Test And Final Overall Summary
Appendix - A: Primitive polynomials for n<100
Appendix - B: Minimum Cost Maximum Length Cellular Automata for n<100
Appendix - C: Fabrication and yield
Index

There are no comments on this title.

to post a comment.
© 2025 by NIMA Knowledge Centre, Ahmedabad.
Koha version 24.05