Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits
Material type:
- 9780792379911
- 621.395 BUS
Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Available | T0036299 | |||
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Checked out | 22/07/2025 | T0034917 | ||
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Available | T0034918 | |||
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Available | T0034531 | |||
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Available | T0034530 | |||
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Available | T0032863 | |||
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NIMA Knowledge Centre | 8th Floor Reading Zone | General | 621.395 BUS (Browse shelf(Opens below)) | Available | T0032864 | |||
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NIMA Knowledge Centre | 6th Floor Silence Zone | Reference | 621.395 BUS (Browse shelf(Opens below)) | Not For Loan | T0026094 |
VLSI Testing Process and Test Equipment Test Economic and Product Quality Fault Modeling Test Methods Logic and Fault Simulation Testability Measurements Combinational Circuit Test Generation Sequential Circuit Test Generation Memory Test DSP-Based Analog and Mixed Signal Test Model Based Analog and Mixed Signal Test Delay Test IDDQ Test Design for Testability Digital DFT and Scan Design Built in Self Test Boundary Scan Standard Analog Test Bus Standard System Test and Core Based Design The Future of Testing Cyclic Redundancy Code Theory Primitive Polynomials of Degree 1 to 100 Books on Testing
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