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Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits

By: Contributor(s): Material type: TextTextPublication details: London Springer-Verlag 2000Description: 690pISBN:
  • 9780792379911
Subject(s): DDC classification:
  • 621.395 BUS
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Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Available T0036299
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Checked out 22/07/2025 T0034917
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Available T0034918
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Available T0034531
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Available T0034530
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Available T0032863
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.395 BUS (Browse shelf(Opens below)) Available T0032864
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 621.395 BUS (Browse shelf(Opens below)) Not For Loan T0026094
Total holds: 0

VLSI Testing Process and Test Equipment Test Economic and Product Quality Fault Modeling Test Methods Logic and Fault Simulation Testability Measurements Combinational Circuit Test Generation Sequential Circuit Test Generation Memory Test DSP-Based Analog and Mixed Signal Test Model Based Analog and Mixed Signal Test Delay Test IDDQ Test Design for Testability Digital DFT and Scan Design Built in Self Test Boundary Scan Standard Analog Test Bus Standard System Test and Core Based Design The Future of Testing Cyclic Redundancy Code Theory Primitive Polynomials of Degree 1 to 100 Books on Testing

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