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Code Based Test Data Compression for SoC Testing: Optimization of Time, Power and Area Overhead

By: Contributor(s): Material type: TextTextPublication details: LAP LAMBERT Academic Publishing 2012Description: 137pISBN:
  • 9783848486311
Subject(s): DDC classification:
  • 621.395 MEH
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Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre Faculty Publication 4th Floor Reading Zone Reference 621.395 MEH (Browse shelf(Opens below)) Not For Loan T0040562
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Introduction Test Data Compression Run Length Code Based Test Data Compression Statistical Code Based Test Data Compression

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