Characterization of Organic Thin Films
Ulman, Abraham
Characterization of Organic Thin Films Ed by Abraham Ulman, C. Richard Brundle, Charles A. Evans, Yale Strausser and Gary E. McGuire - New York Momentum Press 2010 - 276p - Materials Characterization Series .
Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index
9781606500446 0.00
Chemical Engineering
530.4175 / CHA
Characterization of Organic Thin Films Ed by Abraham Ulman, C. Richard Brundle, Charles A. Evans, Yale Strausser and Gary E. McGuire - New York Momentum Press 2010 - 276p - Materials Characterization Series .
Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index
9781606500446 0.00
Chemical Engineering
530.4175 / CHA
