Integrated Circuit Manufacturability: The Art of Process and Design Integration
Gyvez, Jose Pineda de
Integrated Circuit Manufacturability: The Art of Process and Design Integration - New York IEEE Press 1999 - 316p
Introduction Defect Monitoring and Characterization Digital CMOS Fault Modeling and Inductive Fault Analysis Functional Yield Modeling Critical Area and Fault Probability Prediction Statistical Methods of Parametric Yield and Quality Enhancement Architectural Fault Tolerance Design for Test and Manufacturability Testing Solutions for MCM Manufacturing
9780780334472 0.00
Electronic Engineering
621.3815 / INT
Integrated Circuit Manufacturability: The Art of Process and Design Integration - New York IEEE Press 1999 - 316p
Introduction Defect Monitoring and Characterization Digital CMOS Fault Modeling and Inductive Fault Analysis Functional Yield Modeling Critical Area and Fault Probability Prediction Statistical Methods of Parametric Yield and Quality Enhancement Architectural Fault Tolerance Design for Test and Manufacturability Testing Solutions for MCM Manufacturing
9780780334472 0.00
Electronic Engineering
621.3815 / INT