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Proceedings of the 9th International Symposium on Measurement and Quality Control

Proceedings of the 9th International Symposium on Measurement and Quality Control - Madras Indian Institute of Technology 2007

November 21-24, 2007 Chennai, India Keynote Papers Surface Metrology Coordinate Metrology Micro and Nano Metrology Optical Metrology Gear Metrology Modeling and Simulation Quality in manufacturing Quality in Management General Measurements Poster Presentation Author Index

ISBN: 0.00

Subjects--Personal Names:
Mechanical Engineering

Dewey Class. No.: 658.562 / PRO

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