Semiconductor Material and Device Characterization
Schroder, Dieter K.
Semiconductor Material and Device Characterization - 2nd ed - New York John Wiley & Sons, Inc. 1998 - 760p
Resistivity Carrier and Doping Density Contact Resistance, Schottky Barriers and Electromigration Series Resistance, Channel Length and Width Threshold Voltage and Hot Carriers Defects Oxide and Interface Trapped Charges, Oxide Integrity Carrier Lifetime Mobility Optical Characterization Chemical and Physical Characterization
9780471241393 0.00
Electronic Engineering
621.38152 / SCH
Semiconductor Material and Device Characterization - 2nd ed - New York John Wiley & Sons, Inc. 1998 - 760p
Resistivity Carrier and Doping Density Contact Resistance, Schottky Barriers and Electromigration Series Resistance, Channel Length and Width Threshold Voltage and Hot Carriers Defects Oxide and Interface Trapped Charges, Oxide Integrity Carrier Lifetime Mobility Optical Characterization Chemical and Physical Characterization
9780471241393 0.00
Electronic Engineering
621.38152 / SCH