Semiconductor Memories: Technology, Testing and Reliability (Record no. 92345)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00448nam a2200145 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 150427b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9788126548378 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39732 |
| Item number | SHA |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Sharma, Ashok K. |
| 9 (RLIN) | 3238 |
| 245 ## - TITLE STATEMENT | |
| Title | Semiconductor Memories: Technology, Testing and Reliability |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Date of publication, distribution, etc | 2014 |
| Name of publisher, distributor, etc | Wiley India (P) Ltd. |
| Place of publication, distribution, etc | New Delhi |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 460p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Electronic Engineering |
| 9 (RLIN) | 2637 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Item type | Book |
No items available.