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Test Driven Development for Embedded C

By:

Grenning, James

Material type: Text

Text

TextPublication details: Shroff Publisers and Distributors Pvt. Ltd. 2014 MumbaiDescription: 351pISBN:

9789351107965

Subject(s):

Computer Engineering

DDC classification:

005.12 GRE

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Book	NIMA Knowledge Centre	9th Floor Reading Zone	General	005.12 GRE (Browse shelf(Opens below))	Available		T0045074
Book	NIMA Knowledge Centre	9th Floor Reading Zone	General	005.12 GRE (Browse shelf(Opens below))	Available		T0045073

Total holds: 0

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Previous	005.12 GAM Design Patterns: Elements of Reusable Object - Oriented Software	005.12 GAM Design Patterns: Elements of Reusable Object - Oriented Software	005.12 GRE Test Driven Development for Embedded C	005.12 GRE Test Driven Development for Embedded C	005.12 HAW Introduction to Systems Analysis and Design	005.12 HAW Introduction to Systems Analysis and Design	005.12 HAW Introduction to Systems Analysis and Design	Next

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