From Instrumentation to Nanotechnology

By:

Gardner, Julian W

Contributor(s):

Hingle, Harry T

Material type: Text

TextPublication details: India Gordon and Breach Publishers 2005Description: 336pISBN:

9782881247941

Subject(s):

Instrumentation Engineering

DDC classification:

681.2 FRO

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	681.2 FRO (Browse shelf(Opens below))	Not For Loan		T0040764
Book	NIMA Knowledge Centre	6th Floor Reading Zone	General	681.2 FRO (Browse shelf(Opens below))	Available		T0024498

Total holds: 0

Trends in Instrumentation and Nanotechnology Signal Processing Correlation Methods Applied to Instrumentation Mathematical Modelling of Instrumentation - Application and Design Algorithms for Computer Aided Precision Metrology Ultrasonic Sensors Recent Advances in Solid - State Microsensors Nanotechnology Use of Energy Beams for Ultra - high Precision Processing of Materials Control of High Precision Instruments and Machines Optical Metrology: The Precision Measurement of Displacement using optical Interferometry Optical Diffraction for Surface Roughness Measurement Nanoparticle Visualization for Particle Image Velocimetry at Transionic Speeds High Precision Surface Profilemetry: From Stylus to STM Nanoactuators for Controlled Displacements Calibration of Linear Transducers by X- ray Interferometry Index

There are no comments on this title.

to post a comment.