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An Introduction to Mixed Signal IC Text and Measurement

By: Contributor(s): Material type: TextTextPublication details: New Delhi Oxford University Press 2009Description: 684pISBN:
  • 9780198064152
Subject(s): DDC classification:
  • 621.3815 BUR
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Holdings
Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.3815 BUR (Browse shelf(Opens below)) Available T0036793
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.3815 BUR (Browse shelf(Opens below)) Available T0036789
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.3815 BUR (Browse shelf(Opens below)) Available T0036790
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.3815 BUR (Browse shelf(Opens below)) Available T0036791
Book Book NIMA Knowledge Centre 8th Floor Reading Zone General 621.3815 BUR (Browse shelf(Opens below)) Available T0036792
Total holds: 0

Chapter 1: Overview of Mixed-Signal Testing Chapter 2: The Test Specification Process Chapter 3: DC and Parametric Measurements Chapter 4: Measurement Accuracy Chapter 5: Tester Hardware Chapter 6: Sampling Theory Chapter 7: DSP-Based Testing Chapter 8: Analog Channel Testing Chapter 9: Sampled Channel Testing Chapter 10: Focused Calibration Chapter 11: DAC Testing Chapter 12: ADC Testing Chapter 13: DIB Design Chapter 14: Design for Test (DfT) Chapter 15: Data Analysis Chapter 16: Test Economics

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