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Characterization of Organic Thin Films Ed by Abraham Ulman, C. Richard Brundle, Charles A. Evans, Yale Strausser and Gary E. McGuire

By: Ulman, AbrahamContributor(s): Strausser, Yale | McGuire, Gary E | Brundle, C. Richard | Evans, Charles AMaterial type: Text

TextSeries: Materials Characterization SeriesPublication details: New York Momentum Press 2010Description: 276pISBN: 9781606500446Subject(s): Chemical EngineeringDDC classification: 530.4175

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Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Book	Institute of Technology	Reference	530.4175 CHA (Browse shelf(Opens below))	Not For Loan		T0041493

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Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index

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