Characterization of Organic Thin Films Ed by Abraham Ulman, C. Richard Brundle, Charles A. Evans, Yale Strausser and Gary E. McGuire
By: Ulman, Abraham.
Contributor(s): Strausser, Yale | McGuire, Gary E | Brundle, C. Richard | Evans, Charles A.
Material type:
BookSeries: Materials Characterization Series. Publisher: New York Momentum Press 2010Description: 276p.ISBN: 9781606500446.Subject(s): Chemical EngineeringDDC classification: 530.4175
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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Book
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Institute of Technology | Reference | 530.4175 CHA (Browse shelf) | Not For Loan | T0041493 |
Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index
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