Characterization of Organic Thin Films Ed by Abraham Ulman, C. Richard Brundle, Charles A. Evans, Yale Strausser and Gary E. McGuire
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Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Institute of Technology | Reference | 530.4175 CHA (Browse shelf(Opens below)) | Not For Loan | T0041493 |
Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index
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