Image from Amazon.com
Code Based Test Data Compression for SoC Testing: Optimization of Time, Power and Area Overhead
Material type:
TextPublication details: LAP LAMBERT Academic Publishing 2012Description: 137pISBN: - 9783848486311
- 621.395 MEH
| Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Reference Book
|
NIMA Knowledge Centre Faculty Publication | 4th Floor Reading Zone | Reference | 621.395 MEH (Browse shelf(Opens below)) | Not For Loan | T0040562 |
Total holds: 0
Browsing Institute of Technology shelves, Shelving location: Faculty Publication, Collection: Reference Close shelf browser (Hides shelf browser)
|
|
|
|
|
No cover image available |
|
||
| 621.3192 PAT Circuits and Networks | 621.382 SIN Innovations in Information and Communication Technologies (IICT-2020) | 621.384 TRI Wireless Communication Systems | 621.395 MEH Code Based Test Data Compression for SoC Testing: Optimization of Time, Power and Area Overhead | 621.395 OZA VLSI Technology and Design | 621.815 DES Fundamentals and Design of Machine Elements | 629.8 DES Control System Components |
Introduction Test Data Compression Run Length Code Based Test Data Compression Statistical Code Based Test Data Compression
There are no comments on this title.
Log in to your account to post a comment.