Code Based Test Data Compression for SoC Testing: Optimization of Time, Power and Area Overhead
Material type:
- 9783848486311
- 621.395 MEH
Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
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NIMA Knowledge Centre Faculty Publication | 4th Floor Reading Zone | Reference | 621.395 MEH (Browse shelf(Opens below)) | Not For Loan | T0040562 |
Total holds: 0
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621.3192 PAT Circuits and Networks | 621.382 SIN Innovations in Information and Communication Technologies (IICT-2020) | 621.384 TRI Wireless Communication Systems | 621.395 MEH Code Based Test Data Compression for SoC Testing: Optimization of Time, Power and Area Overhead | 621.395 OZA VLSI Technology and Design | 621.815 DES Fundamentals and Design of Machine Elements | 629.8 DES Control System Components |
Introduction Test Data Compression Run Length Code Based Test Data Compression Statistical Code Based Test Data Compression
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