An Introduction to Mixed Signal IC Text and Measurement

By:

Burns, Mark

Contributor(s):

Roberts, Gordon W

Material type: Text

TextPublication details: New York Oxford University Press 2001Description: 684pISBN:

9780195140163

Subject(s):

Electronic Engineering

DDC classification:

621.3815 BUR

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.3815 BUR (Browse shelf(Opens below))	Not For Loan		T0023281

Total holds: 0

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Previous	621.3815 BER Writing Testbenches: Functional Verification of HDL Models	621.3815 BOG Electronic Devices and Circuits	621.3815 BOY Electronic Devices and Circuit Theory	621.3815 BUR An Introduction to Mixed Signal IC Text and Measurement	621.3815 CAS Devices for Integrated Circuits: Silicon and 3 to 5 Compound Semiconductors	621.3815 CAV CMOS RFIC Design Principles	621.3815 CMO INTEL: CMOS INtegrated Circuits	Next

Chapter 1: Overview of Mixed-Signal Testing Chapter 2: The Test Specification Process Chapter 3: DC and Parametric Measurements Chapter 4: Measurement Accuracy Chapter 5: Tester Hardware Chapter 6: Sampling Theory Chapter 7: DSP-Based Testing Chapter 8: Analog Channel Testing Chapter 9: Sampled Channel Testing Chapter 10: Focused Calibration Chapter 11: DAC Testing Chapter 12: ADC Testing Chapter 13: DIB Design Chapter 14: Design for Test (DfT) Chapter 15: Data Analysis Chapter 16: Test Economics

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