Item type | Current library | Item location | Collection | Call number | Status | Date due | Barcode | Item holds | |
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NIMA Knowledge Centre | 6th Floor Silence Zone | Reference | 621.397 MEM (Browse shelf(Opens below)) | Not For Loan | T0003478 |
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621.3950287 NIC Power-Constrained Testing of VLSI Circuits | 621.3950287 TEH Nanometer Technology Designs High-Quality Delay Tests | 621.3950287 TRA Transistor Level Modeling for Analog / RF IC Design | 621.397 MEM Memory Data | 621.39732 BAK CMOS: Mixed Signal Circuit Design | 621.39732 CMO CMOS Logic: Data Book | 621.39732 HIE Integrated Chemical Microsensor Systems in CMOS Technology |
Selector Guide and Cross Reference MOS Dynamic RAMs General MOS Static RAMs CMOS Fast Static RAMs Special Application MOS Static RAMs MOS EEPROMs MECL RAMs MECL PROMs Military Products Reliability Information Applications Information Mechanical Data
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