TY  - BOOK
AU  - Hurst, Stanley L.
TI  - VLSI Testing: Digital and Mixed Analog Digital Tenchiques
SN  - 9780852969014
U1  - 621.395 
PY  - 1998///
CY  - London
PB  - The Institution of Electrical Engineers
KW  - Electronic and Communication Engineering
N1  - Introduction
Faults In Digital Circuits 
Digital Test Pattern Generation 
Signatures And Self Test 
Structured Design For Testability DFT Techniques
Testing Of Structured Digital Circuits And Microprocessors 
Analogue Testing 
Mixed Analogue digital System Test 
The Economics Of Test And Final Overall Summary
Appendix - A: Primitive polynomials for n<100
Appendix - B: Minimum Cost Maximum Length Cellular Automata for n<100
Appendix - C: Fabrication and yield
Index
ER  -