TY  - BOOK
AU  - Breuer, Malvin
AU  - Friedman, Arthur D.
TI  - Diagnosis and Reliable Design of Digital Systems
SN  - 9783642954269
U1  - 621.3815 
PY  - 1976///
CY  - US
PB  - Computer Science Press, Inc.
KW  - Electronics and Communications
N1  - Chapter: 1 Introduction
Chapter: 2 Test Generation for Combinational Circuits
Chapter: 3 Test Generation for Sequential Circuits
Chapter" 4 logic Level Simulation
Chapter: 5 Reliable Design Theory and Techniques
ER  -