From Instrumentation to Nanotechnology - Gardner, Julian W.; Hingle, Harry T. (India Gordon and Breach Publishers, 2005)
Trends in Instrumentation and Nanotechnology Signal Processing Correlation Methods Applied to Instrumentation Mathematical Modelling of Instrumentation - Application and Design Algorithms for Computer Aided Precision Metrology Ultrasonic Sensors Recent Advances in Solid - State Microsensors Nanotechnology Use of Energy Beams for Ultra - high Precision Processing of Materials Control of High Precision Instruments and Machines Optical Metrology: The Precision Measurement of Displacement using optical Interferometry Optical Diffraction for Surface Roughness Measurement Nanoparticle Visualization for Particle Image Velocimetry at Transionic Speeds High Precision Surface Profilemetry: From Stylus to STM Nanoactuators for Controlled Displacements Calibration of Linear Transducers by X- ray Interferometry Index
Keywords: Nanotechnology