TY  - BOOK
AU  - Gardner, Julian W.
AU  - Hingle, Harry T.
TI  - From Instrumentation to Nanotechnology
SN  - 9782881247941
U1  - 681.2 
PY  - 2005///
CY  - India
PB  - Gordon and Breach Publishers
KW  - Nanotechnology
N1  - Trends in Instrumentation and Nanotechnology Signal Processing Correlation Methods Applied to Instrumentation Mathematical Modelling of Instrumentation - Application and Design Algorithms for Computer Aided Precision Metrology Ultrasonic Sensors Recent Advances in Solid - State Microsensors Nanotechnology Use of Energy Beams for Ultra - high Precision Processing of Materials Control of High Precision Instruments and Machines Optical Metrology: The Precision Measurement of Displacement using optical Interferometry Optical Diffraction for Surface Roughness Measurement Nanoparticle Visualization for Particle Image Velocimetry at Transionic Speeds High Precision Surface Profilemetry: From Stylus to STM Nanoactuators for Controlled Displacements Calibration of Linear Transducers by X- ray Interferometry Index
ER  -