TY  - BOOK
AU  - Bushnell, Michael L.
AU  - Agrawal, Vishwani D.
TI  - Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits
SN  - 9780792379911
U1  - 621.395 
PY  - 2000///
CY  - London
PB  - Springer-Verlag
KW  - Electronic Engineering
N1  - VLSI Testing Process and Test Equipment Test Economic and Product Quality Fault Modeling Test Methods Logic and Fault Simulation Testability Measurements Combinational Circuit Test Generation Sequential Circuit Test Generation Memory Test DSP-Based Analog and Mixed Signal Test Model Based Analog and Mixed Signal Test Delay Test IDDQ Test Design for Testability Digital DFT and Scan Design Built in Self Test Boundary Scan Standard Analog Test Bus Standard System Test and Core Based Design The Future of Testing Cyclic Redundancy Code Theory Primitive Polynomials of Degree 1 to 100 Books on Testing
ER  -