TY  - BOOK
AU  - Ravikumar, C. P.
TI  - VLSI Design and Test: Milestones and Challenges
SN  - 9788174840370
U1  - 621.395 
PY  - 2000///
CY  - New Delhi
PB  - Phoenix Publishing House Pvt. Ltd.
KW  - Electronic Engineering
ER  -