TY  - BOOK
AU  - Crouch, Alfred L.
TI  - Design for Test for Digital IC's and Embedded Core Systems
SN  - 9780130848277
U1  - 621.3815 
PY  - 2000///
CY  - New Jersey
PB  - Prentice-Hall, Inc.
KW  - Electronic Engineering
N1  - TCG01013 Test and Design for Test Fundamentals Automatic Test Pattern Generation Fundamentals Scan Architectures and Techniques Memory Test Architectures and Techniques Embedded Core Test Fundamentals
ER  -