TY  - BOOK
AU  - Gyvez, Jose Pineda de
AU  - Pradhan, Dhiraj
TI  - Integrated Circuit Manufacturability: The Art of Process and Design Integration
SN  - 9780780334472
U1  - 621.3815 
PY  - 1999///
CY  - New York
PB  - IEEE Press
KW  - Electronic Engineering
N1  - Introduction Defect Monitoring and Characterization Digital CMOS Fault Modeling and Inductive Fault Analysis Functional Yield Modeling Critical Area and Fault Probability Prediction Statistical Methods of Parametric Yield and Quality Enhancement Architectural Fault Tolerance Design for Test and Manufacturability Testing Solutions for MCM Manufacturing
ER  -