TY - BOOK AU - Girard, Patrick AU - Wen, Xiaoqing AU - Nicolici, Nicola TI - Power Aware Testing and Test Strategies for Low Power Devices SN - 9781441909275 U1 - 621.3815 PY - 0000///201 CY - New York PB - Springer Science+Business Media, Inc KW - Electrical Engineering N1 - Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index ER -