TY  - BOOK
AU  - Girard, Patrick
AU  - Wen, Xiaoqing
AU  - Nicolici, Nicola
TI  - Power Aware Testing and Test Strategies for Low Power Devices
SN  - 9781441909275
U1  - 621.3815 
PY  - 0000///201
CY  - New York
PB  - Springer Science+Business Media, Inc
KW  - Electrical Engineering
N1  - Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index
ER  -