TY  - BOOK
AU  - Schroder, Dieter K.
TI  - Semiconductor Material and Device Characterization
SN  - 9780471241393
U1  - 621.38152 
PY  - 1998///
CY  - New York
PB  - John Wiley & Sons, Inc.
KW  - Electronic Engineering
N1  - Resistivity Carrier and Doping Density Contact Resistance, Schottky Barriers and Electromigration Series Resistance, Channel Length and Width Threshold Voltage and Hot Carriers Defects Oxide and Interface Trapped Charges, Oxide Integrity Carrier Lifetime Mobility Optical Characterization Chemical and Physical Characterization
ER  -