TY  - BOOK
AU  - Jha, N. K.
AU  - Gupta, S.
TI  - Testing of Digital Systems
SN  - 9780521773560
U1  - 621.395 
PY  - 2003///
CY  - Cambridge
PB  - Cambridge University Press
KW  - Electronic Engineering
N1  - Introduction Fault Models Combinational Logic and Fault Simulation Test Generation for Combinational Circuits Sequential ATPG IDDQ Testing Functional Testing Delay Fault Testing CMOS Testing Fault Diagnosis Design for Testability Built in Self Test Synthesis for Testability Memory Testing High Level Test Synthesis System on a Chip Test Synthesis Index
ER  -