TY  - BOOK
AU  - Ulman, Abraham
AU  - Strausser, Yale
AU  - McGuire, Gary E.
AU  - Brundle, C. Richard
AU  - Evans, Charles A.
TI  - Characterization of Organic Thin Films
SN  - 9781606500446
U1  - 530.4175 
PY  - 2010///
CY  - New York
PB  - Momentum Press
KW  - Chemical Engineering
N1  - Part - 1: Preparation and Materials Langmuir Blodgett Films Self Assembled Monolayers Part - 2: Analysis of Film ans Surface Properties Spectroscopic Ellipsometry Infrared Spectroscopy in the Characterization of Organic Thin Films Raman Spectroscopic Characterization of Organic Thin Films Surface Potential X Ray Differaction High Resolution EELS Studies of Organic Thin Films and Surfaces Wetting Secondary Ion Mass Spectrometry As Applied to Thin Oganic and Polymeric Films X Ray Photoelectron Spectroscopy of Organic Thin Films Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation Appendix: Technique Summaries Index
ER  -