VLSI Testing: Digital and Mixed Analog Digital Tenchiques

By:

Hurst, Stanley L

Material type: Text

TextPublication details: The Institution of Electrical Engineers London 1998Description: 532pISBN:

9780852969014

Subject(s):

Electronic and Communication Engineering

DDC classification:

621.395 HUR

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.395 HUR (Browse shelf(Opens below))	Not For Loan		T0048235

Total holds: 0

Introduction
Faults In Digital Circuits
Digital Test Pattern Generation
Signatures And Self Test
Structured Design For Testability DFT Techniques
Testing Of Structured Digital Circuits And Microprocessors
Analogue Testing
Mixed Analogue digital System Test
The Economics Of Test And Final Overall Summary
Appendix - A: Primitive polynomials for n<100
Appendix - B: Minimum Cost Maximum Length Cellular Automata for n<100
Appendix - C: Fabrication and yield
Index

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