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Electron Microscopy in Materials Science

By: Contributor(s): Material type: TextTextPublication details: Singapore World Scientific 1992Description: 687pISBN:
  • 9789810209247
Subject(s): DDC classification:
  • 620.11 ELE
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Item type Current library Item location Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book NIMA Knowledge Centre 6th Floor Silence Zone Reference 620.11 ELE (Browse shelf(Opens below)) Not For Loan T0011434
Total holds: 0

Part - 1: Transmission Electron Microscopy Introduction in Electron Optics Kinematical and Dynamical Differaction Theory Wave Optical Theory of Imaging in Electron Lenses High Resolution Electron Microscopy Electron Holography Electron Crystallography Materials Microstructure: Analysis with High Resolution Analytical Electron Microscopy High Resolution Imaging in the Scanning Transmission Electron Microscope Energy Loss Spectroscopy for Transmission Electron Microscopy X - Ray Microanalysis in the Analytical Electron Microscope Part - 2: Scanning Electron Microscopy Scanning Electron Microscopy the Instrument: Electron Optics and Detectors Secondary and Backscattered Electron Emission in the Scanning Electron Microscope - High Resolution Imaging Notes on the ZAF Algorithm Voltage Contrast Cathodoluminescence in Scanning Electron Microscopy Monte Carlo Simulation of Electron Transport An Introduction to Practical Quantitative EBIC Scanning Tunneling Microscopy Atomic Force Microscopy List of Lectures List of Attendees

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