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	1.	Power Aware Testing and Test Strategies for Low Power Devices by Girard, Patrick Wen, Xiaoqing Nicolici, Nicola Material type: Text Publication details: New York Springer Science+Business Media, Inc 201 Availability: Items available for reference: Institute of Technology: Not For Loan (1)Call number: 621.3815 POW. Add to cart (remove)
	2.	VLSI Test Principles and Architecture Design for Testability by Wang, Laung Terng Wen, Xiaoqing Wen, Cheng Wen Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Francisco Morgan Kaufmann Publishers 2006 Availability: Items available for reference: Institute of Technology: Not For Loan (1)Call number: 621.395 VLS. Add to cart (remove)

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