RF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors

By:

Gao, Jianjun

Material type: Text

TextPublication details: Scitech Publishing Inc. 2020Description: 339pISBN:

9781891121890

Subject(s):

DDC classification:

621.3815284 GAO

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.3815284 GAO (Browse shelf(Opens below))	Not For Loan		T0038070

Total holds: 0

Introduction Representation of Microwave Two - Port Network Microwave and RF Measurement Techniques FET Small Signal Modeling and Parameter Extraction FET Nonlinear Modeling and Parameter Extraction Microwave Noise Modeling and Parameter Extraction Technique for FETs Artificial Neural Network Modeling Technique for FET References Index

There are no comments on this title.

to post a comment.