000 00818nam a2200205Ia 4500
008 140223b2003 xxu||||| |||| 00| 0 eng d
020 _a9780408007580
_c0.00
082 _a540.284
_bJON
245 _aJones' Instrumental Technology: Vol. 3
250 _a4th ed
260 _aSingapore
_bButterworth-Heinemann Asia
_c2003
300 _a206p
500 _aElectrical Measurements Optical Measurements Nucleonic Instrumentation Technology Measurements Employing Nucler Techniuqes Non-destructive Testing Noise Measurement
600 _aElectrical Measurements
_917249
600 _aInstrument Technology
_917244
600 _aRadiation Measurements
_917250
700 _aNoltingk, B. E.
_eEditor
_917246
942 _2ddc
_cLB
_k540.284
_mJON
995 _aPharmacy Reference
_eP00564
_j540.284
_yP00564
999 _c15759
_d15759