| 000 | 01525nam a2200193Ia 4500 | ||
|---|---|---|---|
| 008 | 140223b2005 xxu||||| |||| 00| 0 eng d | ||
| 020 |
_a9782881247941 _c0.00 |
||
| 082 |
_a681.2 _bFRO |
||
| 100 | _aGardner, Julian W. | ||
| 245 | _aFrom Instrumentation to Nanotechnology | ||
| 260 |
_aIndia _bGordon and Breach Publishers _c2005 |
||
| 300 | _a336p | ||
| 500 | _aTrends in Instrumentation and Nanotechnology Signal Processing Correlation Methods Applied to Instrumentation Mathematical Modelling of Instrumentation - Application and Design Algorithms for Computer Aided Precision Metrology Ultrasonic Sensors Recent Advances in Solid - State Microsensors Nanotechnology Use of Energy Beams for Ultra - high Precision Processing of Materials Control of High Precision Instruments and Machines Optical Metrology: The Precision Measurement of Displacement using optical Interferometry Optical Diffraction for Surface Roughness Measurement Nanoparticle Visualization for Particle Image Velocimetry at Transionic Speeds High Precision Surface Profilemetry: From Stylus to STM Nanoactuators for Controlled Displacements Calibration of Linear Transducers by X- ray Interferometry Index | ||
| 600 | _aNanotechnology | ||
| 700 | _aHingle, Harry T. | ||
| 890 | _aIndia | ||
| 891 | _aWork - Industry {QuickPic} | ||
| 995 |
_AFRO _B008375 _CGED-NID _D1850.00 _E0 _F049 _G4827 _H0 _I0.00 _J2500.00 26% _L20090504 _M06 _UC _W20090924 _XMahajan Book Depot _ZGeneral |
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| 999 |
_c22529 _d22529 |
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