000			02607nam a2200265Ia 4500
008			140223b2000 xxu||||| |||| 00| 0 eng d
020			_a9780792379911 _c0.00
082			_a621.395 _bBUS
100			_aBushnell, Michael L.
245			_aEssentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits
260			_aLondon _bSpringer-Verlag _c2000
300			_a690p
500			_aVLSI Testing Process and Test Equipment Test Economic and Product Quality Fault Modeling Test Methods Logic and Fault Simulation Testability Measurements Combinational Circuit Test Generation Sequential Circuit Test Generation Memory Test DSP-Based Analog and Mixed Signal Test Model Based Analog and Mixed Signal Test Delay Test IDDQ Test Design for Testability Digital DFT and Scan Design Built in Self Test Boundary Scan Standard Analog Test Bus Standard System Test and Core Based Design The Future of Testing Cyclic Redundancy Code Theory Primitive Polynomials of Degree 1 to 100 Books on Testing
600			_aElectronic Engineering
700			_aAgrawal, Vishwani D.
890			_aUK
995			_ABUS _B006886 _CECE-PG0 _D884.30 _E0 _F049 _G3657 _H0 _I0.00 _J1195.00 26% _L20080229 _M01 _UC _W20080325 _XMahajan Book Depot _ZGeneral
995			_ABUS _B006886 _CECE-PG0 _D884.30 _E0 _F049 _G3657 _H0 _I0.00 _J1195.00 26% _L20080229 _M01 _UC _W20080325 _XMahajan Book Depot _ZGeneral
995			_ABUS _B004192 _CECE-PG0 _D3980.15 _E0 _F049 _G090034 _H0 _I0.00 _J2985.11 25% _L20060113 _M03 _UC _W20060227 _XHimanshu Book Co. _ZReference
995			_ABUS _B007913 _CECE-PG0 _D884.30 _E0 _F049 _G40434 _H0 _I0.00 _J1195.00 26% _L20081121 _M01 _UC _W20081129 _XBooks India _ZGeneral
995			_ABUS _B007908 _CECT-NIT _D884.30 _E0 _F049 _G4470 _H0 _I0.00 _J1195.00 26% _L20081120 _UC _W20090129 _XMahajan Book Depot _ZGeneral
995			_ABUS _B007908 _CECT-NIT _D884.30 _E0 _F049 _G4470 _H0 _I0.00 _J1195.00 26% _L20081120 _UC _W20090129 _XMahajan Book Depot _ZGeneral
995			_ABUS _B008081 _CECT-NIT _D884.30 _E0 _F049 _G4607 _H0 _I0.00 _J1195.00 26% _L20090116 _UC _W20090429 _XMahajan Book Depot _ZGeneral
995			_ABUS _B007913 _CECE-PG0 _D884.30 _E0 _F049 _G40434 _H0 _I0.00 _J1195.00 26% _L20081121 _M01 _UC _W20081129 _XBooks India _ZGeneral
999			_c32847 _d32847