| 000 | 01938nam a2200229Ia 4500 | ||
|---|---|---|---|
| 008 | 140223b2009 xxu||||| |||| 00| 0 eng d | ||
| 020 |
_a9780198064152 _c0.00 |
||
| 082 |
_a621.3815 _bBUR |
||
| 100 | _aBurns, Mark | ||
| 245 | _aAn Introduction to Mixed Signal IC Text and Measurement | ||
| 260 |
_aNew Delhi _bOxford University Press _c2009 |
||
| 300 | _a684p | ||
| 500 | _aChapter 1: Overview of Mixed-Signal Testing Chapter 2: The Test Specification Process Chapter 3: DC and Parametric Measurements Chapter 4: Measurement Accuracy Chapter 5: Tester Hardware Chapter 6: Sampling Theory Chapter 7: DSP-Based Testing Chapter 8: Analog Channel Testing Chapter 9: Sampled Channel Testing Chapter 10: Focused Calibration Chapter 11: DAC Testing Chapter 12: ADC Testing Chapter 13: DIB Design Chapter 14: Design for Test (DfT) Chapter 15: Data Analysis Chapter 16: Test Economics | ||
| 600 | _aElectronic Engineering | ||
| 700 | _aRoberts, Gordon W. | ||
| 890 | _aIndia | ||
| 995 |
_ABUR _B008516 _CECE-PG0 _D366.30 _E0 _F049 _G4343 _H0 _I0.00 _J495.00 26% _L20090902 _M03 _UC _W20090929 _XMahajan Book DepotT _ZGeneral |
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| 995 |
_ABUR _B008516 _CECE-PG0 _D366.30 _E0 _F049 _G4843 _H0 _I0.00 _J495.00 26% _L20090902 _M03 _UC _W20090929 _XMahajan Book DepotT _ZGeneral |
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| 995 |
_ABUR _B008516 _CECE-PG0 _D366.30 _E0 _F049 _G4843 _H0 _I0.00 _J495.00 26% _L20090902 _M03 _UC _W20090929 _XMahajan Book DepotT _ZGeneral |
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| 995 |
_ABUR _B008516 _CECE-PG0 _D366.30 _E0 _F049 _G4843 _H0 _I0.00 _J495.00 26% _L20090902 _M03 _UC _W20090929 _XMahajan Book DepotT _ZGeneral |
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| 995 |
_ABUR _B008516 _CECE-PG0 _D366.30 _E0 _F049 _G4843 _H0 _I0.00 _J495.00 26% _L20090902 _M03 _UC _W20090929 _XMahajan Book DepotT _ZGeneral |
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| 999 |
_c35670 _d35670 |
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