000 00882nam a2200193Ia 4500
008 140223b2012 xxu||||| |||| 00| 0 eng d
020 _a9783848486311
_c0.00
082 _a621.395
_bMEH
100 _aMehta, Usha Sandeep
245 _aCode Based Test Data Compression for SoC Testing: Optimization of Time, Power and Area Overhead
260 _bLAP LAMBERT Academic Publishing
_c2012
300 _a137p
500 _aIntroduction Test Data Compression Run Length Code Based Test Data Compression Statistical Code Based Test Data Compression
600 _aElectronic Communication
700 _aDevashrayee, N. M.
700 _aDasgupta, K. S.
890 _aGermany
995 _AMEH
_CECT-NIT
_D0.00
_E0
_F049
_H0
_I0.00
_JGratis by VC (USD 78.00)
_UC
_W20120703
_ZReference
999 _c44887
_d44887