000			00848nam a2200169Ia 4500
008			140223b2000 xxu||||| |||| 00| 0 eng d
020			_a9780130848277 _c0.00
082			_a621.3815 _bCRO
100			_aCrouch, Alfred L.
245			_aDesign for Test for Digital IC's and Embedded Core Systems
260			_aNew Jersey _bPrentice-Hall, Inc. _c2000
300			_a349p
500			_aTCG01013 Test and Design for Test Fundamentals Automatic Test Pattern Generation Fundamentals Scan Architectures and Techniques Memory Test Architectures and Techniques Embedded Core Test Fundamentals
600			_aElectronic Engineering
890			_aUSA
995			_ACRO _B003186 _CECE-PG0 _D4517.00 _E0 _F049 _G087873 _H0 _I0.00 _J3388.35 25% _L20050318 _M01 _UR _W20050511 _XHimanshu Book Co. _ZReference
999			_c45237 _d45237