| 000 | 00728nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 140223b2003 xxu||||| |||| 00| 0 eng d | ||
| 020 |
_a9781402072352 _c0.00 |
||
| 082 |
_a621.3950287 _bNIC |
||
| 100 | _aNicolici, Nicola | ||
| 245 | _aPower-Constrained Testing of VLSI Circuits | ||
| 260 |
_aBoston _bKluwer Academic Publishers _c2003 |
||
| 300 | _a178p | ||
| 440 | _aFrontiers in Electronic Testing | ||
| 600 | _aElectrical Engineering | ||
| 700 | _aAl-Hasimi, Bashir M. | ||
| 890 | _aUK | ||
| 995 |
_ANIC _B011119 _CECE-PG0 _D8271.38 _E0 _F049 _GIN494 _H0 _I0.00 _J12400.87 33.30% _L20130530 _M04 _UC _W20130821 _XKushal Books _ZReference |
||
| 999 |
_c48118 _d48118 |
||