000 00562nam a2200169 4500
008 150323b xxu||||| |||| 00| 0 eng d
020 _a9788172248918
082 _a621.381548
_bDIG
245 _aDigital Systems Testing and Testable Design
260 _c2011
_bJaico Publishing House
_aNew Delhi
300 _a652p
650 _aElectronic Engineering
700 _aAbramovici, Miron
_eEditor
700 _aMelvin, A.Breuer
_eEditor
700 _aArthur D. Friedman
_eEditor
942 _2ddc
_cLB
999 _c92346
_d92346