Semiconductor Material and Device Characterization

By:

Schroder, Dieter K

Material type: Text

TextPublication details: New York John Wiley & Sons, Inc. 1998Edition: 2nd edDescription: 760pISBN:

9780471241393

Subject(s):

Electronic Engineering

DDC classification:

621.38152 SCH

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Holdings
Item type	Current library	Item location	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	NIMA Knowledge Centre	6th Floor Silence Zone	Reference	621.38152 SCH (Browse shelf(Opens below))	Not For Loan		T0017014

Total holds: 0

Resistivity Carrier and Doping Density Contact Resistance, Schottky Barriers and Electromigration Series Resistance, Channel Length and Width Threshold Voltage and Hot Carriers Defects Oxide and Interface Trapped Charges, Oxide Integrity Carrier Lifetime Mobility Optical Characterization Chemical and Physical Characterization

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