Design for Test for Digital IC's and Embedded Core Systems
Crouch, Alfred L.
Design for Test for Digital IC's and Embedded Core Systems - New Jersey Prentice-Hall, Inc. 2000 - 349p
TCG01013 Test and Design for Test Fundamentals Automatic Test Pattern Generation Fundamentals Scan Architectures and Techniques Memory Test Architectures and Techniques Embedded Core Test Fundamentals
9780130848277 0.00
Electronic Engineering
621.3815 / CRO
Design for Test for Digital IC's and Embedded Core Systems - New Jersey Prentice-Hall, Inc. 2000 - 349p
TCG01013 Test and Design for Test Fundamentals Automatic Test Pattern Generation Fundamentals Scan Architectures and Techniques Memory Test Architectures and Techniques Embedded Core Test Fundamentals
9780130848277 0.00
Electronic Engineering
621.3815 / CRO