Design for Test for Digital IC's and Embedded Core Systems (Record no. 45237)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00848nam a2200169Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 140223b2000 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780130848277 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Item number | CRO |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Crouch, Alfred L. |
| 245 ## - TITLE STATEMENT | |
| Title | Design for Test for Digital IC's and Embedded Core Systems |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New Jersey |
| Name of publisher, distributor, etc. | Prentice-Hall, Inc. |
| Date of publication, distribution, etc. | 2000 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 349p |
| 500 ## - GENERAL NOTE | |
| General note | TCG01013 Test and Design for Test Fundamentals Automatic Test Pattern Generation Fundamentals Scan Architectures and Techniques Memory Test Architectures and Techniques Embedded Core Test Fundamentals |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Electronic Engineering |
| 890 ## - | |
| -- | USA |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | CRO |
| -- | 003186 |
| -- | ECE-PG0 |
| -- | 4517.00 |
| -- | 0 |
| -- | 049 |
| -- | 087873 |
| -- | 0 |
| -- | 0.00 |
| -- | 3388.35 25% |
| -- | 20050318 |
| -- | 01 |
| -- | R |
| -- | 20050511 |
| -- | Himanshu Book Co. |
| -- | Reference |
No items available.