Nanometer Technology Designs High-Quality Delay Tests
Tehranipoor, Mohammad
Nanometer Technology Designs High-Quality Delay Tests - New York Springer Science+Business Media, Inc 2008 - 281p
Introduction At speed Test Challenges for Nanometer Technology Designs Local At-Speed Scan Enable Generation using Low - Cost Testers Enhanced Launch off Capture Hybrid Scan Based Transition Delay Test Avoiding Functionally Untestable Faults Screening Small Delay Defects Faster Than At Speed Test Considering IR-Drop Effects IR-Drop Tolerant At speed Test Pattern Generation Pattern Generation for Power Supply Noise Analysis Delay Fault Testing in Presence of Maximum Crosstalk Testing SoC Interconnects for Signal Integrity Index
9780387764863 0.00
Electronic Engineering
621.3950287 / TEH
Nanometer Technology Designs High-Quality Delay Tests - New York Springer Science+Business Media, Inc 2008 - 281p
Introduction At speed Test Challenges for Nanometer Technology Designs Local At-Speed Scan Enable Generation using Low - Cost Testers Enhanced Launch off Capture Hybrid Scan Based Transition Delay Test Avoiding Functionally Untestable Faults Screening Small Delay Defects Faster Than At Speed Test Considering IR-Drop Effects IR-Drop Tolerant At speed Test Pattern Generation Pattern Generation for Power Supply Noise Analysis Delay Fault Testing in Presence of Maximum Crosstalk Testing SoC Interconnects for Signal Integrity Index
9780387764863 0.00
Electronic Engineering
621.3950287 / TEH