Nanometer Technology Designs High-Quality Delay Tests (Record no. 47708)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01248nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 140223b2008 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780387764863 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3950287 |
| Item number | TEH |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Tehranipoor, Mohammad |
| 245 ## - TITLE STATEMENT | |
| Title | Nanometer Technology Designs High-Quality Delay Tests |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | Springer Science+Business Media, Inc |
| Date of publication, distribution, etc. | 2008 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 281p |
| 500 ## - GENERAL NOTE | |
| General note | Introduction At speed Test Challenges for Nanometer Technology Designs Local At-Speed Scan Enable Generation using Low - Cost Testers Enhanced Launch off Capture Hybrid Scan Based Transition Delay Test Avoiding Functionally Untestable Faults Screening Small Delay Defects Faster Than At Speed Test Considering IR-Drop Effects IR-Drop Tolerant At speed Test Pattern Generation Pattern Generation for Power Supply Noise Analysis Delay Fault Testing in Presence of Maximum Crosstalk Testing SoC Interconnects for Signal Integrity Index |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Electronic Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Ahmed, Nisar |
| 890 ## - | |
| -- | USA |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | TEH |
| -- | 008927 |
| -- | ECC-PG0 |
| -- | 2944.21 |
| -- | 0 |
| -- | 049 |
| -- | 4989 |
| -- | 0 |
| -- | 0.00 |
| -- | 4089.18 28% |
| -- | 20091216 |
| -- | 01 |
| -- | C |
| -- | 20100118 |
| -- | Mahajan Book Depot |
| -- | Reference |
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