Power Aware Testing and Test Strategies for Low Power Devices
Girard, Patrick
Power Aware Testing and Test Strategies for Low Power Devices - New York Springer Science+Business Media, Inc 201 - 363p
Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index
9781441909275 0.00
Electrical Engineering
621.3815 / POW
Power Aware Testing and Test Strategies for Low Power Devices - New York Springer Science+Business Media, Inc 201 - 363p
Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index
9781441909275 0.00
Electrical Engineering
621.3815 / POW