Power Aware Testing and Test Strategies for Low Power Devices (Record no. 48072)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01201nam a2200181Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781441909275 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Item number | POW |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Girard, Patrick |
| 245 ## - TITLE STATEMENT | |
| Title | Power Aware Testing and Test Strategies for Low Power Devices |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | Springer Science+Business Media, Inc |
| Date of publication, distribution, etc. | 201 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 363p |
| 500 ## - GENERAL NOTE | |
| General note | Summary and Objective of the Book About the Editors Preface Contributors Fundamentals of VLSI Testing Power Issues During Test Low Power Test Pattern Generation Power Aware Design for Test Power Aware Test Data Compression and BIST Power Aware System Level Test Planning Low Power Design Techniques and Test Implications Test Strategies forMultivoltage Designs Test Strategies for Gated Clock Designs Test of Power Management Structures EDA Solution for Power Aware Design for Test Summary Index |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Electrical Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Wen, Xiaoqing |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Nicolici, Nicola |
| 890 ## - | |
| -- | USA |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | POW |
| -- | 011119 |
| -- | ECE-PG0 |
| -- | 8273.58 |
| -- | 0 |
| -- | 049 |
| -- | IN494 |
| -- | 0 |
| -- | 0.00 |
| -- | 12404.17 33.30% |
| -- | 20130530 |
| -- | 03 |
| -- | C |
| -- | 20130821 |
| -- | Kushal Books |
| -- | Reference |
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