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Power-Constrained Testing of VLSI Circuits

Nicolici, Nicola

Power-Constrained Testing of VLSI Circuits - Boston Kluwer Academic Publishers 2003 - 178p - Frontiers in Electronic Testing .

ISBN: 9781402072352 0.00

Subjects--Personal Names:
Electrical Engineering

Dewey Class. No.: 621.3950287 / NIC

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