Power-Constrained Testing of VLSI Circuits (Record no. 48118)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00728nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 140223b2003 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781402072352 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3950287 |
| Item number | NIC |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Nicolici, Nicola |
| 245 ## - TITLE STATEMENT | |
| Title | Power-Constrained Testing of VLSI Circuits |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Boston |
| Name of publisher, distributor, etc. | Kluwer Academic Publishers |
| Date of publication, distribution, etc. | 2003 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 178p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Frontiers in Electronic Testing |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Electrical Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Al-Hasimi, Bashir M. |
| 890 ## - | |
| -- | UK |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | NIC |
| -- | 011119 |
| -- | ECE-PG0 |
| -- | 8271.38 |
| -- | 0 |
| -- | 049 |
| -- | IN494 |
| -- | 0 |
| -- | 0.00 |
| -- | 12400.87 33.30% |
| -- | 20130530 |
| -- | 04 |
| -- | C |
| -- | 20130821 |
| -- | Kushal Books |
| -- | Reference |
No items available.