Testing of Digital Systems
Jha, N. K.
Testing of Digital Systems - Cambridge Cambridge University Press 2003 - 1000p
Introduction Fault Models Combinational Logic and Fault Simulation Test Generation for Combinational Circuits Sequential ATPG IDDQ Testing Functional Testing Delay Fault Testing CMOS Testing Fault Diagnosis Design for Testability Built in Self Test Synthesis for Testability Memory Testing High Level Test Synthesis System on a Chip Test Synthesis Index
9780521773560 0.00
Electronic Engineering
621.395 / JHA
Testing of Digital Systems - Cambridge Cambridge University Press 2003 - 1000p
Introduction Fault Models Combinational Logic and Fault Simulation Test Generation for Combinational Circuits Sequential ATPG IDDQ Testing Functional Testing Delay Fault Testing CMOS Testing Fault Diagnosis Design for Testability Built in Self Test Synthesis for Testability Memory Testing High Level Test Synthesis System on a Chip Test Synthesis Index
9780521773560 0.00
Electronic Engineering
621.395 / JHA