Testing of Digital Systems (Record no. 49026)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00999nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 140223b2003 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780521773560 |
| Terms of availability | 0.00 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.395 |
| Item number | JHA |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Jha, N. K. |
| 245 ## - TITLE STATEMENT | |
| Title | Testing of Digital Systems |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Cambridge |
| Name of publisher, distributor, etc. | Cambridge University Press |
| Date of publication, distribution, etc. | 2003 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1000p |
| 500 ## - GENERAL NOTE | |
| General note | Introduction Fault Models Combinational Logic and Fault Simulation Test Generation for Combinational Circuits Sequential ATPG IDDQ Testing Functional Testing Delay Fault Testing CMOS Testing Fault Diagnosis Design for Testability Built in Self Test Synthesis for Testability Memory Testing High Level Test Synthesis System on a Chip Test Synthesis Index |
| 600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME | |
| Personal name | Electronic Engineering |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Gupta, S. |
| 890 ## - | |
| -- | UK |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] | |
| -- | JHA |
| -- | 004958 |
| -- | ECE-PG0 |
| -- | 4255.39 |
| -- | 0 |
| -- | 049 |
| -- | 2333 |
| -- | 0 |
| -- | 0.00 |
| -- | 5869.50 27.5% |
| -- | 20060926 |
| -- | 04 |
| -- | C |
| -- | 20061208 |
| -- | Mahajan Book Depot |
| -- | Reference |
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